VK-X3000 Series 3D Surface Profiler Image, Measure, and Analyze Nano-Surface Features With the Click of a Button

  • Laser Confocal
  • White Light Interferometry
  • Focus Variation

3 Measurement Principles in 1 System: Unmatched 3D Precision for Any Surface, Any Material, Any Geometry

  • 3D measurement of nano-, micro-, and millimeter-level features
  • Confidently measure surface roughness and topography across intricate and geometrically-challenging surfaces with zero prep
  • Accurately capture surface data from any material, whether it's opaque, mirrored or transparent
Laser Confocal | White Light Interferometry | Focus Variation

Versatile Lighting Options for Detailed Viewing and High Image Quality

  • True-to-life observation of uneven surfaces
  • Enhanced surface texture illumination allows for measurement of small features, such as scratches
  • Achieve SEM-like resolution with the added advantage of full-color imaging

Optimize Efficiency by Automating Inspection Procedures

  • Significantly reduce inspection time
  • Seamless integration with larger stages to accommodate bigger samples

High-precision surface measurement at both low and high magnification

Diverse, high-resolution surface analysis

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You can also contact us at: 1-888-539-3623