3D Measurement Systems
Off-line 3D measurement systems for various industries and applications.
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The XM Series is a handheld coordinate measuring machine (CMM) that lets anyone easily measure 3D/GD&T features. The system is portable and shop-floor ready, so measurements can be taken in any location. The unit also automatically records measurement data and creates detailed inspection reports. The images showcases our latest XM-5000 model which allows high-accuracy measurement for palm-sized parts to large applications.
The Wide Area CMM WM Series of measuring instruments can easily measure the dimensions and shapes of products. Dimensions can be measured with the contact probe and shapes with the laser-scanning probe. The wireless probes eliminate routing limitations, allowing for easy measurement over a wide range. With no need for preprocessing such as spraying and sealing, scanning can be performed quickly and with high accuracy.
The VL-700 Series 3D Scanner CMM is equipped with the world’s first fully automatic CAD conversion function. From scanning to STEP file output, this scanner handles everything automatically. There is no need to go through specialized conversion software to obtain data in a format accessible by CAD software, which eliminates these steps from the work procedure. Furthermore, the newly developed high-resolution transmitter and receiver lenses and WDR (Wide Dynamic Range) CMOS sensor offer twice the detection ability of conventional models. True-to-life scanning makes it possible to obtain accurate 3D data with shape and color information. Using the comparison fitting algorithm, CAD data and coordinates can be used to perform comparative measurements.
The VR-6000 optical profilometer performs non-contact measurement to replace stylus profilometers and roughness meters. This 3D profile system captures full surface data across the target with a resolution of 0.1 µm, enabling measurement of features that cannot be performed with probe-type instruments. The new rotational scanning greatly expands the measurement capabilities of the system. True-to-life cross section measurements can be performed with no blind spots. Wall thicknesses and recessed features can be measured without cutting or destroying the target. In addition, the HDR scanning algorithm provides enhanced scanning capabilities for instantly determining the optimal settings to capture high quality data, even on glossy and matte surfaces.
The VK-X3000 3D Surface Profiler uses a triple scan approach, where laser confocal scanning, focus variation, and white light interferometry measurement methods are used, so that high-accuracy measurement and analysis can be performed on any target. The VK-X3000 has a resolution of 0.01 nm and can scan areas up to 50 x 50 mm (1.97" x 1.97"), allowing for measurement of the overall shape of the target while still maintaining high-resolution for analysis of minute surface features. KEYENCE's new 3D Surface Profiler can handle any target, including those with transparent or mirrored surfaces, large height changes, or steep angles.
